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Preprint Sep 2026

Simultaneous Drift Calibration and Reconstruction for Scanning-Probe X-Ray Tomography

Scanning-probe x-ray tomography is useful for imaging nanoscale structures of a sample. The image resolution, which can reach down to 10 nm by the increased brightness and coherence of the x-ray optics, however, is highly susceptible to experimental error. Failure to address these errors can lead to a smeared image and...

Xiang Huang, P. Brahmbhatt, Chang Meng et al. · 6 citations

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