FS-YOLO: A Lightweight Insulator Defect Detection Method Based on Multi-Level Feature Fusion and Localization Quality Estimation
To address the challenges of low localization accuracy for insulator defects in complex inspection scenarios and excessive model redundancy that hinders edge deployment, this paper proposes FS-YOLO, a lightweight defect detection algorithm. First, a C3k2 ConvFormer Gated Linear Unit (C3k2-CFGLU) module replaces the ori...