This work investigates diffusion inference using a noise model calibrated and validated against measurements collected from multiple physical CIM chips, and proposes ASSERT, a training-free sampler that uses higher stochasticity early and smoothly transitions to deterministic denoising.
Abstract
Diffusion models achieve strong image generation quality but incur high iterative denoising costs. Analog compute-in-memory (CIM) can accelerate matrix-vector multiplications, yet spatial memory variations perturb weights and accumulate during sampling. Unlike conventional neural networks, diffusion models'temporal sensitivity to hardware noise remains underexplored. We investigate diffusion inference using a noise model calibrated and validated against measurements collected from multiple physical CIM chips. Our results show that the early, high-noise denoising stage is substantially more vulnerable than the final refinement stage. A first-order trajectory analysis attributes this behavior to the repeated propagation of correlated prediction errors induced by a fixed hardware mapping. Based on this observation, we propose ASSERT, a training-free sampler that uses higher stochasticity early and smoothly transitions to deterministic denoising. The injected stochasticity changes subsequent activation trajectories and thereby reduces their alignment with persistent spatial errors. Across the evaluated settings, ASSERT achieves up to 2.58$\times$ lower FID than deterministic DDIM on high-resolution datasets and 7.68$\times$ lower FID in the CIFAR-10 step-count study, without changing model parameters or the number of network evaluations.
Experimental results and decoupling ablations demonstrate that SANI consistently improves Fr\'echet Inception Distance (FID) over the vanilla DDPM and DDIM endpoint samplers across diverse sampling timesteps, while remaining competitive with variance-learning baselines, highlighting the importance of spatial adaptivity...
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