From Static Structures to Molecular Dynamics: Emerging Directions in X-Ray and Electron Materials Characterization

Abstract

Structural analysis using X-rays and electron beams has long provided the average arrangement of atoms and molecules—that is, “structural information”—with high precision. By contrast, static measurements cannot directly yield dynamic information on how a material changes over time; instead, information on motion is convolved into a single numerical value such as the B-factor (atomic displacement parameter). Taking this limitation as its starting point, this review surveys the recent trend of introducing a time axis into measurements to observe material dynamics directly. First, we outline the technological foundations that have made the transition from static to time-resolved measurement possible. It rests on the dramatic shortening of exposure times, enabled by the increased brilliance of X-ray and electron sources and by advances in detection technology such as direct photon-counting detectors. Next, we survey dynamic measurement techniques, including time-resolved X-ray crystallography, coherent X-ray scattering, neutron scattering, and time-resolved electron microscopy. We also point out the essential limitation that most of them still return ensemble or volume averages. Building on this, we systematically describe diffracted X-ray tracking (DXT), diffracted X-ray blinking (DXB), small-angle X-ray blinking (SAXB), transmitted X-ray blinking (TXB), and electron-beam molecular dynamics (EBMD), which use gold nanocrystals and gold nanoparticles as motion probes. We distinguish throughout between methods that follow individual objects—DXT and EBMD, which yield trajectories of single labeled molecules or single particles—and methods that analyze intensity fluctuations arising from many contributors within one pixel or illuminated volume—DXB, SAXB and TXB. The latter are not single-molecule measurements; rather, they replace a global ensemble average by a spatially localized statistical one, retaining local heterogeneity that a bulk measurement would average away. Finally, we discuss the implementation and prospects of the large-volume data analysis—principal component analysis, Bayesian inference, machine learning, and autonomous measurement—needed to handle the explosively increasing amount of information that the time axis introduces. We close with the outlook that time-resolved measurement incorporating AI and big-data analysis will become established as a new measurement platform that complements and extends conventional static structural analysis.