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Oct 2026

Study on nonlinear spatial stitching method of SICM images based on adaptive region candidates.

Scanning Ion Conductance Microscopy (SICM) can realize three-dimensional, non-invasive imaging of living biological cells, and has made significant progress in fields such as cell biology and medicine. However, constrained by the maximum motion range of the piezoelectric actuator (e.g., 100 μm × 100 μm), it always make...

Xiao-Bo Liao, Wen-Lin Wu, Zhi-Wu Wang et al. · 0 citations
Open access Sep 2026

An AFM DNA image-segmentation method based on random height mapping and a Sobel-guided attention module

Results indicate that combining imaging-aware height-to-color encoding with training-time randomized mapping and lightweight, gradient-guided reweighting of skip features offers a practical route to robust and stable AFM–DNA segmentation, with potential transferability to other AFM image-analysis tasks.

Xin-Hang Cui, Lin-Yan Xu, Zhuo-Fei Wang et al. · 0 citations
Preprint Oct 2026

Autocorrelation-based beam shape optimization in scanning electron microscopy

Many automatically focusing algorithms for scanning electron microscopes exist. Typically, these optimize a single derived metric (such as image sharpness) without considering the intrinsic beam shape. We describe an algorithm to automatically focus and stigmate scanning electron microscopes based on the autocorrelatio...

Rebecca Guan, Andreas Werbrouck, Matthew M. Maschmann et al. · 0 citations
Open access Sep 2026

A U-Net-based approach for automated segmentation of scanning artifacts in multi-modal cellular AFM images

Here we present a method for the automatic segmentation of imaging artifacts in atomic force microscopy (AFM) maps collected on cell surfaces. The method is based on a U-Net convolutional neural network architecture and uses multi-channel AFM data, including height, adhesion, and restored adhesion maps acquired in Peak...

Aleksei A. Krylov, Ian S. Budakian, E. Sherstyukova et al. · 0 citations
Conference Oct 2026

Single-pixel microscopy compressive sampling strategy supported by pupils’ prior information

This contribution presents a compressive sampling method for single-pixel microscopy (SPM) which takes into account the properties of the optical system. In SPM, structured patterns are demagnified over the sample plane in order to retrieve an image of the object under study. The quality of the recovered image depends...

L. Ordóñez, H. Tobón-Maya, S. Zapata-Valencia et al. · 0 citations
Open access Aug 2026

Self-supervised image denoising and restoration method for atomic force microscopy

Scanning probe microscopy (SPM) distinguishes itself from light and electron microscopy by sensing surface interactions with a nanoscale probe, rather than relying on the detection of particles or waves; and has evolved into a versatile tool across several fundamental and applied research fields. SPM uses raster-scanni...

Si-Chen Pan, Simon Scheuring · 0 citations

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