Aug 2026· Journal of Applied Physics· Vol 140· 0 citations· 58 references
Abstract
Combinatorial materials libraries provide an efficient route for mapping composition–property relationships, but their broader impact depends on rapid, quantitative, and functionally relevant characterization. Scanning Probe Microscopy (SPM), including piezoresponse force microscopy (PFM), offers significant potential for quantitative, functionally relevant combi-library readouts. Here, we implement a fully automated SPM workflow for ferroelectric combinatorial libraries and benchmark Gaussian-process-based Bayesian optimization strategies for autonomous experiment planning. The workflow integrates automated probe motion, contact optimization, imaging, and dual amplitude resonance tracking-PFM spectroscopy, and uses scalarized spectroscopic observables to guide subsequent measurements. Stage motion, probe engagement, in-contact tuning, imaging, spectroscopy, and the choice of the next measurement location all proceed without human input. We demonstrate the approach on Sm-doped BiFeO3 and ZnxMg1−xO libraries. By comparing vanilla Bayesian optimization with a measured-noise variant, we show that explicit treatment of local reproducibility can improve modeling of composition-dependent response when the measured variance is physically meaningful, but can also reduce robustness when variability is dominated by outliers or topographic artifacts. These results establish automated SPM as a bridge between combinatorial synthesis and quantitative functional characterization.
Atomic-scale phase imaging is central to resolving defects, interfaces, and weakly scattering atoms that govern the behavior of nanoscale materials. Electron ptychography delivers sub-{\aa}ngstr\"om phase sensitivity but remains an offline technique, because its iterative reconstruction is computationally expensive and...
H. Yue, Charles B. Chen, C.-N. Hsiao et al.· 0 citations
Scanning ion conductance microscopy (SICM) enables high-resolution, noncontact, in situ characterization of specimens in liquid environments, providing simultaneous access to three-dimensional (3D) topographical, electrical, and mechanical properties. Despite its versatility, the inherent imaging principle limits scann...
Qiang-Qiang Zheng, L. Kang, Wen-Lin Wu et al.· Analytical Chemistry· 0 citations
Scanning Electron Microscopy (SEM) is a foundational technique for characterizing material microstructure, which dictates many fundamental physical and chemical properties. With the rise of Self-Driving Labs (SDLs), samples are now synthesized in large batches, demanding equally high-throughput, autonomous characteriza...
Kevin Zhang, M. Taha, R. Castañeda et al.· 0 citations
Three-dimensional (3D) chemical characterization at the transistor level is increasingly required for root-cause failure analysis (FA) of advanced semiconductor devices, whose yield-limiting defects are intrinsically volumetric. Multimodal electron tomography combining high-angle annular dark-field (HAADF) scanning/t...
Ajinkya A. Kadu, Maadhav Kothari, Malvika P. Prasad et al.· International Symposium for...· 0 citations
Scanning probe microscopy (SPM) has become a mainstay of materials science, condensed matter physics, nanotechnology, biology, and semiconductor metrology. An SPM image, however, is acquired sequentially as the probe traverses the surface under closed-loop feedback while thermal drift, feedback dynamics, tip state, mec...
Surya Prakash Reddy, Sergei V. Kalinin· 0 citations
We use cookies to run the site and, with your consent, for analytics and to show ads.
See our Cookie Policy.