Skip to content

EFEM-YOLO: an efficient feature extraction network for surface defect detection of photovoltaic cell

Jul 2026 · Engineering Research Express · Vol 8, pp. 155304 · 0 citations · 40 references
Physics

Abstract

Stable operation of photovoltaic (PV) cells is crucial for reliable and efficient electricity generation in power systems. However, their poor defect characterization, large size variation, and high background noise lead to low automatic identification accuracy. In this paper, a YOLO-based network with an efficient feature extraction network, termed EFEM-YOLO, is proposed for accurate defect detection in PV cells. First, a multi-scale dilated convolution feature pyramid module is proposed. By constructing an adaptive feature pyramid via parallel convolutional paths, it enhances the representation of multi-scale defects. Second, the C2f-dynamic gated activation network is introduced. By incorporating a dynamic gated nonlinear activation mechanism and a cross-stage dual-branch feature aggregation strategy, the model’s adaptability to multi-scale defects and recognition accuracy are improved. Finally, a novel SmartShapeIoU loss function is proposed. This mitigates localization bias caused by object scale variations in high-noise environments, thereby improving bounding box regression accuracy. Experimental results demonstrate that the proposed method outperforms state-of-the-art methods in detection accuracy. Additional dataset experiments validate the superior detection accuracy and generalization of the proposed method for small object detection.

View source

Similar papers

Conference Aug 2026

A Photovoltaic Cell Defect Detection Method Based on Improved RT-DETR

In photovoltaic cell manufacturing, various surface defects including cracks, black cores, and finger interruptions may be introduced during production and operation, leading to reduced power generation efficiency, accelerated degradation, and potential module failure. Although deep learning-based methods have advanced...

Jing-Ling Zhang, Yu-Cheng Yu, Guang-Guang Yang et al. · 0 citations
Conference Sep 2026

Research on surface defect detection method for photovoltaic panels based on MSP2-YOLOv11

Solar photovoltaic technology is experiencing a period of rapid growth, and the share of photovoltaic systems in the overall energy structure is steadily increasing. However, due to their widespread distribution and the inherent difficulties associated with their maintenance, surface defects on PV panels—such as cracks...

Chao-Yi Ge · 0 citations
Open access Aug 2026

MC-YOLO: A Lightweight Insulator Defect Detection Model Based on an Improved YOLOv8

Due to the fast growth of China’s electric power industry, the total length of high-voltage transmission lines has been continuously increasing. As a key component of high-voltage transmission systems, insulators play a critical role, and achieving efficient and accurate defect detection for insulators is of great sign...

Jun-Lian Wang, Zhi-Xiong Li, Jin-Quan Yang et al. · 0 citations
Open access 2026

Photovoltaic Anomaly Detection in Electroluminescence Images Using a Transformer-Enhanced YOLO Algorithm

Accurate and efficient detection of defects during the manufacturing process of photovoltaic (PV) panels is critical for ensuring product quality and operational reliability. However, developing lightweight deep learning models capable of handling diverse defect types remains a significant challenge. To address this is...

Mehmet Fatih Bekciogullari, H. Acikgoz, S. Ozbay · 0 citations
Open access Sep 2026

FS-YOLO: A Lightweight Insulator Defect Detection Method Based on Multi-Level Feature Fusion and Localization Quality Estimation

To address the challenges of low localization accuracy for insulator defects in complex inspection scenarios and excessive model redundancy that hinders edge deployment, this paper proposes FS-YOLO, a lightweight defect detection algorithm. First, a C3k2 ConvFormer Gated Linear Unit (C3k2-CFGLU) module replaces the ori...

Cong-Jie Wen, Zhi-Liang Zhu, Yi-Jian Weng et al. · 0 citations
Open access Aug 2026

An optimized YOLOv11-based model for surface defect detection on valve stems in refrigeration equipment

Surface defect detection on industrial components remains challenging due to difficult feature extraction, low detection accuracy in complex backgrounds, and high computational demands. To address these challenges, this study presents the RDD-YOLO model based on the YOLOv11n architecture. The proposed model replaces...

Jiadong Dong, Feihu Sang, Hao Sun et al. · 0 citations

We use cookies to run the site and, with your consent, for analytics and to show ads. See our Cookie Policy.