A versatile digital twin for simulating the electron beam trajectory throughout an electron microscope, and the calibration procedures required for accurate prediction of microscope states are developed.
Abstract
Novel experiments in transmission electron microscopy often require the development of specialized imaging and spectroscopy states, such as for flexible momentum-resolved high energy-resolution spectroscopy. This task is complicated by the need to align and configure many different lenses, and by ambiguity around the locations of various imaging and diffraction planes. Here we develop a versatile digital twin for simulating the electron beam trajectory throughout an electron microscope, and we develop the calibration procedures required for accurate prediction of microscope states. This allows the user to quickly and easily determine the correct lens values for setting up new condenser or projector modes. Automatic procedures to change lens settings and measure the resulting changes can be used to close the loop. With the accelerating development of machine learning and artificial intelligence tools, we also believe a physically-informed model of the microscope can serve as a valuable tool for automated microscopy and AI/ML integration.
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