Development of a robust preprocessing framework using the CRCHEKF to handle noisy and incomplete data; design of an IGANN that explains the contribution of each feature to power dissipation; integration of the PSOA for adaptive parameter tuning to enhance accuracy and generalization provide a unified and transparent power estimation framework for both pre- and post-synthesis analysis in VLSI circuits.
Accurate estimation of power is a main requirement throughout the use of Complementary Metal–Oxide–Semiconductor Very Large-Scale Integration (CMOS VLSI) because it determines how efficiently energy is used; how hot a device will get from high temperatures; whether a device will work properly over long periods of time...
V. Govindaraj, M. Sheela, P. M. Krishnammal et al.· Discover Computing· 0 citations
To overcome the limitations of traditional State of Charge (SOC) prediction methods such as complex models and poor environmental adaptability, this paper proposes a real-time lithium battery SOC prediction device that integrates a Back- Propagation (BP) neural network with a high-performance STM32 micro-controller. In...
Hong-Tao Niu, Jun-Yi Li, Yong-Qiu Ma et al.· European Conference on Elect...· 0 citations
Scaling of complementary metal-oxide-semiconductor (CMOS) technology into the deep-nanometre regime has made the simultaneous minimisation of power and propagation delay one of the hardest problems in very-large-scale integration (VLSI) design. Supply voltage, threshold-voltage assignment, transistor sizing, body biasi...
Ankit Soni· International Journal of Adv...· 0 citations
To address the systematic errors introduced by the coupling of excitation current drift, reference voltage drift, and ADC gain/offset in PT1000 platinum resistance measurement systems, this paper proposes an error-structure-aware two-stage compensation framework. A three-dimensional physical feature vector is derived f...
Qi-Tao Liu, Yi Fan· International Conference on...· 0 citations
Addressing the challenges of nonlinear noise interference and dynamic parameter estimation in measuring silicon carbide epitaxial layer thickness during semiconductor manufacturing, this study establishes a deep data analysis system integrating adaptive signal processing and robust optimization algorithms. During featu...
Le-Tian Chen, Youbo Lian· ITM Web of Conferences· 0 citations
We present the first implementation of the analog gradient accumulation with dynamic reference (AGAD), reported as the most advanced and highest-performing version of the TT (Tiki-Taka) algorithm, on an HfO2-based resistive random-access memory (RRAM) array for analog neural network training. Through comparative simula...
Ji-Min Lee, Paul Solomon, N. Gong et al.· Science Advances· 0 citations
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