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Sponsored Artificial Intelligence: A Modern Approach, Global Edition Artificial Intelligence: A Modern Approach, Global Edition

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B. Yenen

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Open access Aug 2026

A drift‐aware framework for reliability assessment and image‐based interpretation of atomic force microscopy measurements

The results indicate that the proposed framework should be positioned not as a universal drift‐correction method, but as a complementary and modular analysis approach that supports the drift‐aware interpretation, comparison, and reliability assessment of consecutive AFM topography measurements.

D. Deveci, Ö. Ünverdi, B. Yenen et al. · 0 citations

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