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Sponsored AI Networking Cookbook: Practical recipes for AI-assisted network automation and development AI Networking Cookbook: Practical recipes for AI-assisted network automation and development

Author

Jane Y. Li

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2 papers indexed here

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Oct 2026

Determining Optimal FIB Access Points Using DFT-Guided Simulation Data

The adoption of backside power delivery (BPD) for advanced semiconductor integrated circuit (IC) chips introduces significant electrical fault isolation (EFI) challenges. The lack of direct optical access to the device's FET layer severely impacts techniques such as laser voltage probing and imaging (collectively, LV...

Shaleen Acharya, Manish Sharma, Jayant D'Souza et al. · 0 citations
Review Oct 2026

AI-Driven Super-Resolution Enhancement of Scanning Electron Microscopy Images for Semiconductor Failure Analysis

Scanning electron microscopy (SEM) is central to semiconductor failure analysis (FA), but high-resolution acquisition is slow, and fast survey scans often lack the detail needed to decide where to look closely. We report two results on enhancing low-detail SEM images of static random-access memory (SRAM) arrays. Firs...

Alexey Solovey, J. Elliott, Chuan Zhang et al. · 0 citations

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