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Author

Ö. Ünverdi

2 papers indexed here

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Open access Aug 2026

A drift‐aware framework for reliability assessment and image‐based interpretation of atomic force microscopy measurements

The results indicate that the proposed framework should be positioned not as a universal drift‐correction method, but as a complementary and modular analysis approach that supports the drift‐aware interpretation, comparison, and reliability assessment of consecutive AFM topography measurements.

D. Deveci, Ö. Ünverdi, B. Yenen et al. · 0 citations
Open access Sep 2026

A computational framework for post-acquisition stability assessment in scanning tunneling microscopy

The proposed approach combines deterministic computer vision-based analyses with modern deep learning components in a hybrid workflow, producing pixel-level drift metrics together with local and surface-level image-similarity indicators based on the structural similarity index measure and normalized cross-correlation.

D. Deveci, Ö. Ünverdi, F. Yıldırım et al. · 0 citations

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