Open access
Aug 2026
A drift‐aware framework for reliability assessment and image‐based interpretation of atomic force microscopy measurements
The results indicate that the proposed framework should be positioned not as a universal drift‐correction method, but as a complementary and modular analysis approach that supports the drift‐aware interpretation, comparison, and reliability assessment of consecutive AFM topography measurements.
D. Deveci, Ö. Ünverdi, B. Yenen et al.
· Journal of Microscopy · 0 citations