2026· Proceedings of the 4th International Conference on Image, Algorithms, and Artificial Intelligence, ICIAAI 2026, 22-24 May 2026, Singapore, Singapore· 0 citations· 4 references
TL;DR
This study investigates the feasibility of using simple regression-based machine learning models to approximate MOSFET Direct Current and small-signal characteristics obtained from LTspice simulations and shows that polynomial regression achieves very high fitting accuracy.
Abstract
. Accurate modeling of MOSFET characteristics is essential for analog circuit design, where designers commonly rely on SPICE simulations to predict transistor behavior under different bias conditions. However, repeated SPICE simulations can become computationally expensive during design exploration and optimization. This study investigates the feasibility of using simple regression-based machine learning models to approximate MOSFET Direct Current (DC) and small-signal characteristics obtained from LTspice simulations. Linear regression and second-order polynomial regression are used to model the relationships between the gate-to-source voltage (VGS) and two outputs: drain current (Id) and small-signal voltage gain (Av). Results show that polynomial regression achieves very high fitting accuracy. For the Id–VGS relationship, the coefficient of determination is approximately one, indicating that the quadratic model closely matches the simulated data within the studied operating range. For the Av–VGS relationship, the coefficient of determination improves from 0.920 to about 0.990, while the RMSE decreases from 1.53 dB to 0.55 dB.
Prototyping and early-stage circuit evaluation for emerging transistor technologies require fast and accurate compact models for SPICE simulations. Standard physics-based compact models, such as BSIM, offer high fidelity but demand extensive domain expertise and time-consuming equation formulation for every new physica...
Rodion Novkin, Simon Thomann, Hussam Amrouch· 0 citations
Analog and radio-frequency integrated-circuit sizing commonly relies on repeated manual analysis and SPICE simulation. This study investigates supervised regression models as computationally efficient surrogates for estimating circuit performance from device geometry, bias settings, and passive-component values. Three...
Ali H. Hamad· Jurnal Pilar Nusa Mandiri· 0 citations
Transfer characteristics are essential for device modeling and circuit design in various applications. Transfer characteristics measurements for high voltage power devices are usually carried out in a curve tracer. Due to the limitation of the experimental setup, the pulse length is typically longer than $\mathbf{2 0 0...
Wen-Qi Zhou, Hadiuzzaman Syed, M. Horváth et al.· 2026 Energy Conversion Congr...· 0 citations
Gallium Nitride (GaN) transistors offer many advantages for power electronics converters, such as compact size and high-frequency operation. However, accurate loss estimation and calculation of the various losses in these transistors are generally more complicated compared to other power semiconductors due to the devic...
Yasser Yousefi Zandabad, J. Friebe· 2026 Energy Conversion Congr...· 0 citations
Estimating the power semiconductor device junction temperature in high-power converters is critical to study their durability and monitor their degradation. This paper presents a faster simulation workflow and its application on a 12-SiC MOSFET single-phase power module for automotive traction inverter applications. Fi...
Raphaël Morvillier, R. Gwoziecki, Célestin Ott et al.· 2026 Energy Conversion Congr...· 0 citations
We use cookies to run the site and, with your consent, for analytics and to show ads.
See our Cookie Policy.