The impact of analog CIM nonidealities on DiT sampling is characterized and a retraining-free, sampler-side recalibration that adjusts only the CFG scale for a given CIM condition is proposed, showing that the optimal guidance scale increases with CIM noise.
Abstract
Diffusion Transformers (DiTs) incur high memory traffic and energy costs because sampling repeatedly evaluates large denoisers dominated by linear operations. Analog compute-in-memory (CIM) can alleviate these costs by executing linear operations within weight-storing memory arrays. However, CIM nonidealities perturb effective weights, with errors accumulating along the state-dependent denoising trajectory; their interaction with classifier-free guidance (CFG) remains underexplored. In this paper, we characterize the impact of analog CIM nonidealities on DiT sampling. Although conditional and unconditional predictions can each remain close to their clean counterparts, their difference (the CFG residual) is disproportionately attenuated and rotated. Identifying this residual as a controllable failure channel, we propose a retraining-free, sampler-side recalibration that adjusts only the CFG scale for a given CIM condition. Trajectory-level analysis shows that moderate recalibration strengthens the target-oriented component preserved in the distorted residual, enabling earlier commitment to a prompt-consistent semantic region. In contrast, excessive guidance amplifies the full noisy residual and degrades quality, resulting in a finite, noise-dependent optimum. Extensive experiments on PixArt-Sigma, PixArt-alpha, and DiT-XL/2 show that the optimal guidance scale increases with CIM noise. Using 30,000 samples per condition, guidance recalibration consistently restores generation quality across simulated CIM mappings, closing at least 87% of the CIM-induced FID gap at a CIM noise level of 0.20. It reduces FID from 59.22 to 20.49 on PixArt-Sigma, 72.37 to 21.12 on PixArt-alpha, and 20.89 to 6.62 on DiT-XL/2.
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