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Adapting DNNs to Embrace Voltage Scaling Induced Errors via Accumulation-Aware Quantization

Oct 2026 · 0 citations · 35 references
Computer Science

TL;DR

This work aims to address energy-reliability trade-offs in DNNs by introducing a hardware-software co-design methodology, based on the observation that timing-robust bit ranges within the accumulator of a systolic array vary significantly across different voltage-frequency operating points.

Abstract

The pervasive deployment of Deep Neural Networks (DNNs) across the computing spectrum has brought growing attention to energy efficiency, alongside raw performance. While voltage scaling is a potent knob for power reduction, its application in next-generation nodes is hampered by severe throughput degradation and susceptibility to process variation. This work aims to address these energy-reliability trade-offs by introducing a hardware-software co-design methodology, based on the observation that timing-robust bit ranges within the accumulator of a systolic array vary significantly across different voltage-frequency operating points. At the software level, we propose an Accumulation-Aware Training approach that incorporates this information as a first-order optimization constraint during training. By integrating mixed-precision quantization with unstructured pruning, we effectively constrain the model's weight distribution to avoid activating the hardware's sensitized high-rank carry chains. At the architectural level, we complement this with selective MSB-masking and fine-grained clock-gating to minimize unnecessary dynamic switching activity. Furthermore, we employ a layer-wise Dynamic Frequency Scaling strategy to further adapt to the accumulator's reduced dynamic range, based on the numerical sensitivity of each layer. We experimentally evaluate the proposed solution on a deep scaled 2nm technology node and demonstrate that, when operating at a low-voltage frontier, our co-optimized post-layout architecture delivers substantial energy and energy-delay product gains of 39% and 23% respectively, relative to the nominal voltage implementation, while maintaining accuracy degradation within 1%.

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